![[Pasted image 20240817145514.png]] # X-Ray Diffraction Analysis (XRD) of Quartz Sample Explanation of the [X-Ray Diffraction (XRD)](app://obsidian.md/X-Ray%20Diffraction%20(XRD)) Analysis Report for the sample submitted by Carbonatik. This report was prepared by NSL Analytical Services, Inc. ## 1. Sample Information [[S-240710-177 Quartz]] - Sample Description: Quartz powder - Sample Number: S-240710-177 - Client: Carbonatik - Analysis Date: July 18, 2024 - Report Number: R-20240710-106 ## 2. Methodology ### 2.1 Sample Preparation The quartz powder sample was packed into a sample holder and pressed with a glass slide to ensure a flat, uniform surface for analysis. ### 2.2 Instrumentation - Diffractometer: Rigaku Miniflex - Radiation Source: Cu Kα - Filter: Ni Kβ - Detector: D/teX Ultra high-speed detector ### 2.3 Scan Parameters Two scans were performed with the following settings: 1. Scan 1: - Range: 5° to 100° 2θ - Speed: 8.0° 2θ/min - Step Size: 0.4° 2θ/step 2. Scan 2: - Range: 7° to 94° 2θ - Speed: 0.5° 2θ/min - Step Size: 0.1° 2θ/step ## 3. Analysis Technique Semi-quantitative phase identification was performed using Whole Pattern Fitting (WPF), a subset of Rietveld Refinement. This method accounts for variations in crystal structure, including lattice parameters and orientation factors. ## 4. Results ### 4.1 Phase Identification - Identified Phase: SiO2 (Quartz) - Crystal System: Trigonal - Space Group: 154 - Reference: Rigaku NIST ICSD # 173226 - Concentration: 100% (±5 wt%) ### 4.2 Fit Quality - Rwp Value: 14.34% - Interpretation: Moderate agreement between experimentally observed data and calculated phase presence ## 5. Interpretation and Discussion ![[Pasted image 20240817145658.png]] The XRD analysis reveals that the sample is composed entirely of quartz (SiO2) with a trigonal crystal structure. The following points are noteworthy: 1. Purity: The 100% concentration suggests a high-purity quartz sample with no detectable crystalline impurities. 2. Crystal Structure: The trigonal structure and Space Group 154 are consistent with α-quartz, the most common form of quartz at room temperature. 3. Fit Quality: The Rwp value of 14.34% indicates a moderate fit between the observed and calculated diffraction patterns. This suggests that while the phase identification is reliable, there might be some minor discrepancies in peak intensities or positions. 4. Absence of Amorphous Content: The analysis does not report any amorphous content, suggesting the sample is highly crystalline. 5. Potential Minor Phases: While no other phases were detected, the ±5 wt% uncertainty in the quantification leaves room for the possibility of trace impurities below the detection limit of the XRD technique. ## 6. Limitations and Considerations 1. Detection Limit: XRD typically has a detection limit of about 1-5% for crystalline phases, depending on the specific phase and instrument settings. 2. Amorphous Content: Standard XRD analysis may not accurately quantify amorphous content without additional techniques. 3. Preferred Orientation: The sample preparation method (pressing) could potentially induce some preferred orientation in the quartz crystals, which might affect peak intensities. ## 7. Conclusion The XRD analysis conclusively identifies the sample as **high-purity quartz** with a trigonal crystal structure. The absence of other detectable crystalline phases suggests that if any impurities are present, they are either in trace amounts below the detection limit or in an amorphous form not easily quantifiable by standard XRD techniques. The moderate Rwp value indicates a good, though not perfect, fit between the observed and calculated patterns, which is typical for natural mineral samples. This analysis provides a robust characterization of the quartz sample's crystalline structure and purity, suitable for various scientific and industrial applications. <hr/> <!-- Your main content goes here --> <div class="footer"> Carbonatik © 2024 </div>